Special sessions at I²MTC 2009 are being organized on the following topics:
1. TECHNOLOGICAL INNOVATIONS FOR THE E-LEARNING IN INSTRUMENTATION AND MEASUREMENT
Organizer:
Domenico Grimaldi, University of Calabria
The experience of the e-learning in the education on Instrumentation and Measurement (I&M) at different levels, included the degree courses and the long life learning, suggests new and interesting aspects to be examined. The use of multimedia communication tools as a channel to reach the students or workers have introduced new and specific requirements not previous considered and invite to explore new directions. Several solutions based on internet and/or Digital Video Transmission as communication channels and mobile computing enable the realization of flexible customized solutions for specific measurement educational tools on demand.
This Special Session deals with all technological problems concerning: innovation, quality, reality, innovative requirements for the development, aspects connected to the interoperability of the e-learning.
Topics may include any issue related to e-learning based educational facilities, laboratories, and especially:
- Studies on the content of a modern multimedia-based I&M course;
- Non-traditional teaching approaches using multimedia technology;
- Innovations related to the laboratory practice educational tools, technological equipment, and content) due to multimedia-based approaches;
- Multimedia-based continuing education and training related to I&M.
2. CHARACTIRIZATION OF ADVANCED MATERIALS
Organizers:
Domenico Grimaldi, University of Calabria and Alfonso Nastro, University of Calabria
With the on-going proliferation of emerging new and advanced materials, for example those based on nano-tube or shape memory metals, comes the need for specific procedures for their electrical, magnetic, and mechanical characterization.
This Special Session deals with problems concerning the characterization of the properties of new advanced materials based on emerging advancements in material science and technology.
3. INSTRUMENTATION AND MEASUREMENT METHODS FOR RAMS (RELIABILITY, AVAILABILITY, MAINTAINABILITY & SAFETY) ANALYSIS AND QUALITY CONTROL FOR COMPONENTS AND SYSTEMS
Organizers:
Marcantonio Catelani, University of Florence, Italy
Loredana Cristaldi, Politecnico of Milan, Italy
Massimo Lazzaroni, University of Milan, Italy
Lorenzo Peretto, University of Bologna, Italy
Paola Rinaldi, University of Bologna, Italy
Ferdinanda Ponci, Department of Electrical Engineering, University of South Carolina, USA
The Special Session will allow engineers and researchers, involved in measurements methodologies, to meet and discuss about live issues. Nowadays RAMS requirements, in terms of Reliability, Availability, Maintainability and Safety, represent fundamental tasks for modern components, equipments and complex systems. RAM requirements are strictly correlated to Quality and Quality growth. They play a key rule in:
- evaluation of life-cycle costs
- risk assessment and management
- logistic support
- safety evaluation
- mission capability
- design review
- reliability prediction
- certification
- product liability
- standards definition
RAMS requirements are also related to diagnostics and fault diagnosis. Hence, grouping all the researchers who usually work in the field of instrumentation and measurement methods for both the RAMS evaluation and analysis of complex systems, as well as quality and quality control, useful and beneficial discussion can be promote with the aim to provide an increasing of knowledge and an easier diffusion of the most recent findings and proposals in this field. Prospective authors can provide original contributions in this topic which can cover, but not only, the following aspects:
- Instrumentation and measurement methodologies for fault diagnosis
- Reliability and Quality growth
- Design and implementation of reliability laboratory tests (reliability test, ESS test, Burn-in test, etc.)
- Built-in Test Equipment (BITE)
- Automatic Test Equipment (ATE)
- Qualification tests for components and assemblies
- Measurements for availability improvement and assurance
- Analytical models and algorithms for predictive reliability and maintainability
- Effects of measurement uncertainty on the estimation of the availability parameters (i.e. MTBF, MTTR, etc.)
4. FAULT-DETECTION, FAULT-DIAGNOSIS AND FAULT-TOLERANCE IN SYSTEM-ON-CHIP (SoC) AND SYSTEM-IN-PACKAGE (Sip)
Organizers:
Prof. Sunil R. Das, PhD, University of Ottawa, Ottawa, ON, Canada and State University, Montgomery, AL, U.S.A.
Prof. Serge Demidenko, PhD, School of Engineering, Monash University, Australia-Malaysia & TC-32 of IEEE I&M Society
Prof. Nohpill Park, PhD, Department of Computer Science, Oklahoma State University, Stillwater, OK, USA & TC-32 of IEEE I&M Society
Modern advances in design, fabrication and test are enabling the on-going fast progress in SoC (System-on-Chip or in other terms System-Level-Integration) and SiP (System-in-Package or in other terminology Multi-Chip Module) technologies. At the same time the emergence of high-complexity SoC and SiP paradigms, leads to the need of significant improvement of the systems reliability. Fault-detection, fault-diagnosis and fault-tolerance are at the core of in achieving this goal.
This special session will cover all aspects of theory and practice of SoC/SiP design, fabrication and test with a special interest devoted to fault-detection, fault-diagnosis and fault-tolerance and the other closely relevant fields. Particular interest will be paid to new instrumentation and measurement methods, techniques and tools aimed at improving testability, diagnosability, fault-tolerance and reliability of modern micro- and nano-scale circuits and systems.
The topics of the session include but not confined to:
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Innovative micro- and nano-scale circuit and system design methodologies, techniques and tools
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Advanced design-for-test and built-in self test solutions and engineering practices
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New methods and architectures of fault-tolerant circuits and systems
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Manufacturing test, diagnostics and failure analysis solutions
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Advances in semiconductor fabrication technology and challenges related to the instrumentation and measurement in SoC/SiP manufacturing.
5. SPECIAL SESSION ON MEDICAL MEASUREMENTS AND INSTRUMENTATION
Organizers:
Marco Parvis, Politecnico of Turin, Italy & TC-25 of IEEE I&M Society
Sergio Rapuano, University of Sannio, Italy & TC-25 of IEEE I&M Society
Measurement problems in medical applications are continuously increasing and several examples exist that process measurement data from different instruments in order to derive specific knowledge about the patient status from the vital parameters. The Special Session on Medical Measurements and Instrumentation focuses on all the aspects related to sensors and measurements in the medical field and on all the kinds of interaction between the instrumentation and measurement field and the medical field.
Main topics, but not limited to, include:
- Sensors for medical systems
- Medical specific instrumentation
- Embedded systems and signal processing for medical applications
- Sensor fusion and calibration in medical environment
- Standards and medical applications
- Biometrics
- Digital imaging and communication in medicine
6. INTELLIGENT SENSORS AND INSTRUMENTATION FOR ROBOTICS AND AUTOMATION
Organizers:
Chris Messom, Massey University, New Zealand
Gourab Sen Gupta, Massey University, New Zealand
Intelligent Sensors and Instrumentation are becoming critical in Robotics and Automation. Computational Intelligence techniques such as Neural Networks, Fuzzy Systems, Genetic and Evolutionary Algorithms have been used to improve the performance of these systems enabling new and emerging distributed intelligent systems to truly cooperate or collaborate without relying on central control. Localized intelligence in the sensors allows signals of interest to be selected and processed while background noise signals are discarded, significantly improving the bandwidth, power and storage characteristics of robotics, automation and sensor network systems. Greater computational power and intelligence of the sensors manifests into greater potential for performance improvements of the system.
This special session brings together theoreticians and practical engineers promoting the dissemination of all topics relevant to innovative intelligent sensors and instrumentation and in particular novel applications in the fields of robotics, automation and sensor networks.
Topics include, among others:
- Vision guided intelligent robotics
- Principles, concepts and advances in sensors for intelligent automation
- New sensors and novel methods for teleoperation
- Robust and adaptive calibration methodologies
- Self-diagnosis and auto-calibration
- Image processing for security and cooperation in multi-agent operations
- Models, theories and optimal principles of sensor fusion for collaborative systems
- Computational Intelligence (CI) for sensors and instrumentation
The firm submission deadline: DECEMBER 4, 2008