2011 IEEE International Instrumentation and Measurement Technology Conference - May 10-12, 2011 - Hangzhou, China
CALL FOR PAPERS
The Conference focuses on all aspects of instrumentation and measurement science and technology–research, development and applications. The program topics include but are not limited to:
FUNDAMENTALS
- Theoretical foundations
- Quantities, units & standards
- Calibration & self-calibration
- Measurement uncertainty
- Methodology of teaching
- Modeling of signals and systems
SENSORS AND TRANSDUCERS
- Smart sensors and sensor networks
- Optical, chemical and biological sensors Wireless sensors Sensor arrays
- Energy harvesting Sensor standards Sensor applications
MEASUREMENTS OF PHYSICAL QUANTITIES
- Electrical & power measurements
- Dielectric & magnetic measurements
- Temperature, moisture & humidity
- measurements
- Mechanical measurements
- Optical measurements
- Chemical & biological measurements
MEASUREMENT-DATA &SIGNAL PROCESSING
- A/D and D/A converters
- Analog and mixed signal processing
- Data preprocessing & postprocessing
- Digital signal processing
- Digital image processing
- Pattern recognition
- Inverse problems & signal reconstruction Signal detection & classification
- Sensor array processing Data mining and fusion
MEASUREMENT SYSTEMS
- Fault-tolerant & resilient measurement systems
- Integrated & visual measurement systems
- Distributed measurement systems
- Autonomous measurement systems
- Non-invasive measurement systems
- Virtual measurement systems
- Measurement microsystems
- Human-computer interface
- Automated test & diagnostics systems
MEASUREMENT APPLICATIONS
- Health care
- Food safety and security
- Quality assurance and authentication<>Renewable energy systems
- Carbon capture and storage
- Plant optimization
- Environmental monitoring
- Intelligent buildings
- Multiphase flow measurement
- Soft sensing and soft computing
- Robotics and industrial monitoring
- Automotive & transportation
- Avionics and aerospace
- Ships and marine technology
- Medicine and scientific research
- Security and biometrics
- Telecommunications
- Remote sensing
Potential authors are invited to submit extended abstracts via the I²MTC website (http://imtc.ieee-ims.org/).
Each extended abstract (3 or 4 pages in English) should report results of the original research of theoretical or applied nature. The extended abstract should, moreover, explain the significance of the contribution and contain a list of key references. It must be prepared according to the abstract preparation guidelines provided on the I²MTC website. A Student Paper Contest will be held for both graduate and undergraduate student papers, with cash awards for the best papers and travel subsidies ranging from USD 300 to USD 1000 depending on student location. Extended abstracts should be submitted by the students according to the rules posted on the website and should be identified as student papers. Check that website for detailed instructions and deadlines at http://imtc.ieee-ims.org/
IMPORTANT DATES
*October 25, 2010 – Deadline for submission of extended abstracts.
* December 20, 2010 – Notification of authors of acceptance or rejection decisions.
* March 1, 2011 – Deadline for the submission of camera-ready full-text papers.
The extended abstracts will be reviewed by the Technical Program Committee.
The authors of accepted papers must register for the Conference and attend to present their papers. The authors of papers, presented during I²MTC 2011, will be allowed to submit expanded and extended versions of their papers to the Special Issue of IEEE Transactions on Instrumentation & Measurement on I²MTC 2011 to be published in 2012.
